Oxygen Vacancies in PbTiO$_3$ Thin Films Probed by Resonant Raman Spectroscopy
Résumé
Resonant Raman spectroscopy was applied to evaluate oxygen vacancies in PbTiO3$_{–x}$ thin films that were heat treated in a hydrogen atmosphere at various temperatures. Additional mode related to oxygen vacancies occurred in the resonant Raman measurement condition, and its intensity was in proportion to the oxygen vacancy concentration. This correlation offers a simple and useful probe for oxygen vacancies in oxide-based devices.